Comparative Study of Sub-Micron Buried-Channel Delta Doped Mosfets . Journal of Science and Technology, [S. l.], v. 19, n. 1,2&3, 2016. DOI: 10.4314/just.v19i1,2&3.852. Disponível em: https://journal.knust.edu.gh/index.php/just/article/view/852. Acesso em: 11 jun. 2026.