Origin of Interface States in Silicon/ Silicon-Dioxide System - A Piezoelectric Model. Journal of Science and Technology, [S. l.], v. 11, n. 1, p. 36–42, 2016. DOI: 10.4314/just.v11i1.1062. Disponível em: https://journal.knust.edu.gh/index.php/just/article/view/1062. Acesso em: 12 jun. 2026.